*** Please excuse multiple postings ***
GI/ITG/GMA Technical Committee Dependability and Fault Tolerance
Call for Papers, 16th Workshop on Dependability and Fault Tolerance (VERFE
2021)
in conjunction with 33rd ARCS 2021, virtual, June, 2021
Background and Focus: Although the basic reliability of hardware and
software components has improved
over decades, their increasing number causes severe problems. Moreover, in
recent years it can be observed
that an increasing number of devices are integrated into environments of
other physical components such
as cars or digital systems. Here, the complexity and number of interactions
with these components creates
problems with regard to maintaining a dependable operation of the entire
system in case of faults or external
disturbances. While this is not a problem with microprocessors, shrinking
feature sizes, higher complexity,
lower voltages, and higher clock frequencies increase the probability of
design-, manufacturing-, and operational
faults, making fault tolerance techniques in general purpose processors to
be of crucial importance
in the future. As simple solutions (such as TMR) can easily get too
expensive, the ability to trade increased
reliability against performance/power overhead will become important,
resulting in light-weight fault tolerance
techniques implemented in hardware, but controllable from higher software
layers.
This workshop aims at presenting contributions and work-in-progress from the
research area of dependable
and fault-tolerant computing in order to bring together scientists working
in related fields.
Topics Contributions on the topic of Dependable Embedded Systems are of
particular interest; contributions
on general topics of dependability and fault tolerance are also welcome but
not limited to:
dependable computer systems, networks and embedded systems
dependability of mechatronic systems
fault-tolerant systems and system components
safety-critical applications
highly available systems
real-time and performance guarantees
testing of hardware and software
fault detection and fault treatment
failure prediction
modeling, simulation and evaluation of fault-tolerant systems
reliability models for hardware and software
validation and verification
fault models and fault abstraction
fault injection techniques
on-chip fault-tolerance
software-controlled fault tolerance
fault-tolerant processor architecture
fault-tolerance in operating systems, storage and database systems
The workshop will focus on research presentations as well as brainstorming
sessions.
Therefore, two kinds of contributions are welcome:
* research papers documenting results of scientific investigations and
* position papers proposing strategies or discussing open problems.
Accepted papers will be published by VDE and IEEExplore.
Papers should be in English and formatted according to IEEE eXpress
conference mode.
Selected papers will appear in the FERS Journal (ISSN 0724-5319).
Deadlines:
Submission: *** EXTENDED *** April 30th, 2021 (ext. abstracts (3-4 pages) or
full papers (max. 8 pages), PDF) to: bernhard.fechner(a)fernuni-hagen.de
Notification: May 10th, 2021
Camera-ready: May 24th, 2021 (max. 8 pages)
Workshop Chairs
Bernhard Fechner
FernUniversität in Hagen
Germany
Peter Sobe
HTW Dresden
Germany
Karl-Erwin Großpietsch
St. Augustin
Germany
Program Committee
Lars Bauer
Karlsruhe Institute of Technology
Germany
Fevzi Belli
University of Paderborn
Germany
Greg Bronevetsky
X the moonshot factory
USA
Rainer Buchty
TU Braunschweig
Germany
Klaus Echtle
University of Duisburg-Essen
Germany
Wolfgang Ehrenberger
University of Fulda
Germany
Rolf Ernst
TU Braunschweig
Germany
Bernhard Fechner
University of Hagen
Germany
Michael Gössel
University of Potsdam
Germany
Jörg Henkel
Karlsruhe Institute of Technology
Germany
John Hursey
Oak Ridge National Laboratory
USA
Jörg Keller
FernUniversität in Hagen
Germany
Hans-Dieter Kochs
University of Duisburg-Essen
Germany
Minh Lê
Siemens AG
Nuremberg
Miroslaw Malek
USI-Lugano
Switzerland
Erik Maehle
University of Lübeck
Germany
Michael Mock
Fraunhofer
St. Augustin
Dimitris Nikolos
University of Patras
Greece
Francesca Saglietti
University of Erlangen-Nuremberg
Germany
Toshi Sato
University of Fukuoka
Japan
Martin Schulz
TU Munich
Germany
Muhammad Shafique
TU Vienna
Austria
Peter Sobe
HTW Dresden
Germany
Janusz Sosnowski
University of Warsaw
Poland
Carsten Trinitis
TU Munich
Germany
Peter Tröger
TU Chemnitz
Germany
Heinrich Theodor Vierhaus
TU Cottbus
Germany
Max Walter
Siemens AG
Nuremberg
Norbert Wehn
TU Kaiserslautern
Germany
Josef Weidendorfer
TU Munich
Germany
Sebastian Zug
TU Freiberg
Germany
