*** Please excuse multiple postings ***

GI/ITG/GMA Technical Committee “Dependability and Fault Tolerance”

Call for Papers, 16th Workshop on Dependability and Fault Tolerance (VERFE 2021)

in conjunction with 33rd ARCS 2021, virtual, June, 2021

Background and Focus: Although the basic reliability of hardware and software components has improved over decades, their increasing number causes severe problems. Moreover, in recent years it can be observed that an increasing number of devices are integrated into environments of other physical components such as cars or digital systems. Here, the complexity and number of interactions with these components creates problems with regard to maintaining a dependable operation of the entire system in case of faults or external disturbances. While this is not a problem with microprocessors, shrinking feature sizes, higher complexity, lower voltages, and higher clock frequencies increase the probability of design-, manufacturing-, and operational faults, making fault tolerance techniques in general purpose processors to be of crucial importance in the future. As simple solutions (such as TMR) can easily get too expensive, the ability to trade increased reliability against performance/power overhead will become important, resulting in light-weight fault tolerance techniques implemented in hardware, but controllable from higher software layers. This workshop aims at presenting contributions and work-in-progress from the research area of dependable and fault-tolerant computing in order to bring together scientists working in related fields.

Topics Contributions on the topic of “Dependable Embedded Systems“ are of particular interest; contributions on general topics of dependability and fault tolerance are also welcome but not limited to:

• dependable computer systems, networks and embedded systems • dependability of mechatronic systems • fault-tolerant systems and system components • safety-critical applications • highly available systems • real-time and performance guarantees • testing of hardware and software • fault detection and fault treatment • failure prediction • modeling, simulation and evaluation of fault-tolerant systems • reliability models for hardware and software • validation and verification • fault models and fault abstraction • fault injection techniques • on-chip fault-tolerance • software-controlled fault tolerance • fault-tolerant processor architecture • fault-tolerance in operating systems, storage and database systems

The workshop will focus on research presentations as well as brainstorming sessions. Therefore, two kinds of contributions are welcome:

* research papers documenting results of scientific investigations and * position papers proposing strategies or discussing open problems.

Accepted papers will be published by VDE and IEEExplore. Papers should be in English and formatted according to IEEE eXpress ”conference mode”. Selected papers will appear in the FERS Journal (ISSN 0724-5319).

Deadlines: Submission: *** EXTENDED *** April 30th, 2021 (ext. abstracts (3-4 pages) or full papers (max. 8 pages), PDF) to: bernhard.fechner@fernuni-hagen.de Notification: May 10th, 2021 Camera-ready: May 24th, 2021 (max. 8 pages)

Workshop Chairs

Bernhard Fechner

FernUniversität in Hagen

Germany

Peter Sobe

HTW Dresden

Germany

Karl-Erwin Großpietsch

St. Augustin

Germany

Program Committee

Lars Bauer

Karlsruhe Institute of Technology

Germany

Fevzi Belli

University of Paderborn

Germany

Greg Bronevetsky

X the moonshot factory

USA

Rainer Buchty

TU Braunschweig

Germany

Klaus Echtle

University of Duisburg-Essen

Germany

Wolfgang Ehrenberger

University of Fulda

Germany

Rolf Ernst

TU Braunschweig

Germany

Bernhard Fechner

University of Hagen

Germany

Michael Gössel

University of Potsdam

Germany

Jörg Henkel

Karlsruhe Institute of Technology

Germany

John Hursey

Oak Ridge National Laboratory

USA

Jörg Keller

FernUniversität in Hagen

Germany

Hans-Dieter Kochs

University of Duisburg-Essen

Germany

Minh Lê

Siemens AG

Nuremberg

Miroslaw Malek

USI-Lugano

Switzerland

Erik Maehle

University of Lübeck

Germany

Michael Mock

Fraunhofer

St. Augustin

Dimitris Nikolos

University of Patras

Greece

Francesca Saglietti

University of Erlangen-Nuremberg

Germany

Toshi Sato

University of Fukuoka

Japan

Martin Schulz

TU Munich

Germany

Muhammad Shafique

TU Vienna

Austria

Peter Sobe

HTW Dresden

Germany

Janusz Sosnowski

University of Warsaw

Poland

Carsten Trinitis

TU Munich

Germany

Peter Tröger

TU Chemnitz

Germany

Heinrich Theodor Vierhaus

TU Cottbus

Germany

Max Walter

Siemens AG

Nuremberg

Norbert Wehn

TU Kaiserslautern

Germany

Josef Weidendorfer

TU Munich

Germany

Sebastian Zug

TU Freiberg

Germany